Automatic characterisation method for statistical evaluation of tin whisker growth

作者：Krammer Oliver^*; Illes Balazs; Batorfi Reka; Dusek Karel

来源：Microelectronics Reliability, 2017, 73: 14-21.

DOI：10.1016/j.microre12017.04.007

• Tin whisker
• Automatic whisker characterisation
• Thin film
• Image thresholding
• Mean intercept length

In this paper, an automatic method was developed to characterise whisker growth quantitatively in SEM images. The key step of the automatic methods in this case is the determination of the optimal threshold value for image segmentation, i.e. separation of the objects (whiskers) from the background (substrate). A thresholding method was developed for this purpose and was compared to manual and to general purpose automatic methods as references. As it was proven in previous studies the vacuum deposited tin layers on copper substrates can produce numerous tin whiskers in various shapes and lengths in a short time. This layer deposition technology was therefore chosen for the comparison of the thresholding methods. Images of the produced whiskers were captured by a FEI Inspect S50 Scanning Electron Microscope. By executing the automatic methods in the captured images, the area density of the whiskers, and the maximum and the mean length of the whiskers were measured. Based on the results of area density, the automatic methods were compared to manual counting and the Mean Absolute Percentage Error (MAPE) was determined. Finally, the reference automatic methods were compared to the self-developed method from the maximum and mean length of whiskers point of view.

• 出版日期2017-6