Determining the Impact of Within-Die Variation on Circuit Timing

作者：Bashir Muhammad Muqarrab^*; Milor Linda

来源：IEEE Transactions on Semiconductor Manufacturing, 2011, 24(3): 385-391.

DOI：10.1109/TSM.2011.2152865

• Statistical static timing analysis
• timing analysis
• variation

This paper aims to develop a method to determine the impact of within-die variation in transistors on circuit timing, separately from die-to-die variation. To do this, we find a set of corners that detect all critical paths due to within-die variation. Hence, a finite number of simulations is used to explore the impact within-die variation.

• 出版日期2011-8