Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission

作者：Ohashi Naoki^*; Yoshikawa Hideki; Yamashita Yoshiyuki; Ueda Shigenori; Li Jianyong; Okushi Hideyo; Kobayashi Keisuke; Haneda Hajime

来源：Applied Physics Letters, 2012, 101(25): 251911.

DOI：10.1063/1.4772628

The platinum/[niobium-doped strontium titanate] junction (Pt/SrTiO3:Nb) was investigated by x-ray photoemission (XPE) spectroscopy. Aluminum K alpha and synchrotron radiation (6 keV) were used to obtain XPE spectra with different probing depths. The broadening and shift of the XPE peaks for SrTiO3:Nb, which resulted from the formation of a potential barrier at the interface, were quantitatively analyzed by fitting simulations. The barrier height was calculated to be 0.7-0.8 regardless of the Nb concentration. Furthermore, the XPE profile of the junction was reproduced when the permittivity of SrTiO3 was assumed to depend on the electric field. VC 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4772628]

• 出版日期2012-12-17