AFM, EDS and XRD microstructural characterizations of Pd-Ag/PSS membranes

作者：Wen Hsiung Lin^*; Hsin Fu Chang

来源：Journal of the Chinese Institute of Chemical Engineers, 2006, 37(3): 239-247.

• sequential electroless plating
• Pd-Ag/PSS membrane
• scanning electron microscopy
• energy dispersive spectroscopic analysis
• atomic force microscopy

In the present investigation, dense, defect free palladium and palladium-silver alloy membranes were prepared on porous stainless steel by means of the sequential electroless plating technique. Full characterizations of the Pd-Ag/PSS membranes were performed using scanning electron microscopy (SEM), energy dispersive spectroscopic analysis (EDS), atomic force microscopy (AFM), and an X-ray diffractometer (XRD). AFM images showed that in the electroless plating process, lower skin layer roughness and a lower deposition rate were related. Although deposition was conducted through a sequential process, the surfaces on or inside the substrate showed homogenous deposition, as determined through EDS analysis. XRD reflection peaks indicated that the palladium and silver together formed a homogeneous alloy after annealing. The relationship between the average lattice spacing and peak positions can be used to estimate the membrane composition.

• 出版日期2006-5