Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

作者：Wu Y Z^*; Zhao Y; Arenholz E; Young A T; Sinkovic B; Won C; Qiu Z Q

来源：Physical Review B, 2008, 78(6): 064413.

DOI：10.1103/PhysRevB.78.064413

Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L(2) absorption edge, XLD effect at the Ni L(3) absorption edge is also measured and analyzed. The results identify a small energy shift of the L(3) peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x rays originates entirely from the NiO magnetic ordering.

• 出版日期2008-8
• 单位复旦大学