Microrigidity and profile analysis method with AFM

作者:Liu Qing Gang*; Li De Chun; Wang Zhan; Hu Xiao Dong; Hu Xiao Tang; Satoshi Kiyono
来源:Journal of Tianjin University, 2003, 36(2): 174-177.

摘要

There is the large deformation of the sample';s surface caused by the contact force between AFM tip and sample surface when an AFM is used to image soft samples such as polymers or biological objects. This deformation can be revealed directly in the force-indentation curves. In this paper, we calculate the local Young';s moduli E based on the force-indentation curves with AFM, and discuss the method to lighten the influence mentioned above to obtain high resolution images of soft samples with our AFM used in liquid. This method can be used not only to determine the local elasticity for imaging the surface with high resolution, but also to analysis the microcosmic characteristics by under standing the deformation mechanism of materials.

全文