摘要

Measuring surfaces with high reflectivity variation via structured light illumination requires accurately identifying saturated pixels in captured images. However, conventional methods simply determine saturation by intensities, which is susceptible to a camera blurring effect and random noise. To solve this problem, we present a method that uses the magnitude of a nonprincipal frequency component to identify saturated pixels. Experimental results demonstrate that 1) higher accuracy of three-dimensional reconstruction can be achieved and 2) high-contrast surfaces can be accurately reconstructed.