摘要
The electrical behavior of diamondlike carbon (DLC) has been measured as a function of depth. The amorphous carbon (a-C) films are deposited by pulsed laser deposition using two complementary setups: a femtosecond (fs) and a nanosecond (ns) pulse lasers. It is demonstrated through four probe resistance measurements and contact resistance mapping that the fs DLC are electrically heterogeneous in thickness. The presence of a thick sp(2) rich layer on top is evidenced for fs a-C and is apparently away in the sp(3) rich ns a-C. It is attributed to different subplantation processes between ns and fs a-C films.
- 出版日期2010-4-19