Analysis and Simulation of AC-Biased TES Circuits

作者：Wang Tian Shun^*; Chen Jun Kang; Zhou Xingxiang

来源：IEEE Transactions on Applied Superconductivity, 2015, 25(5): 2101916.

DOI：10.1109/TASC.2015.2470668

• Circuit analysis
• computer simulation
• superconducting devices

We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-fluid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our findings to results for the analysis of dc-biased TES circuits, we give appropriate definitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.

• 出版日期2015-10
• 单位中国科学技术大学; 中国科学院; 中国航天科工集团公司