Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

作者：Chang Joe Ming; Chang Wei Yu; Chen Fu Rong; Tseng Fan Gang^*

来源：Nanoscale Research Letters, 2013, 8(1): 519.

DOI：10.1186/1556-276X-8-519

• Electrostatic
• Teflon
• Nanoparticle
• Atomic force microscopy

A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN.

• 出版日期2013-12-7
• 单位清华大学