科研之友
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摘要
A polycapillary X-ray optics is developed and used in a micro-area XRD residual stress measurement. The results are compared with the traditional pinhole method. Both diffraction intensity and peak height obtained from the application of this polycapillary are enhanced by dozens of times than that from the pinhole method. The experimental results exhibit the advantage of this polycapillary optics in the micro-area residual stress measurement with higher detectable signal and more accuracy.
- 出版日期2015-7
- 单位北京市辐射中心; 北京师范大学
