Multiple ionization of atomic argon irradiated by EUV free-electron laser pulses at 62 nm: evidence of sequential electron strip

作者：Motomura K^*; Fukuzawa H; Foucar L; Liu X J; Pruemper G; Ueda K; Saito N; Iwayama H; Nagaya K; Murakami H; Yao M; Belkacem A; Nagasono M; Higashiya A; Yabashi M; Ishikawa T; Ohashi H; Kimura H

来源：Journal of Physics B: Atomic, Molecular and Optical Physics , 2009, 42(22): 221003.

DOI：10.1088/0953-4075/42/22/221003

We have investigated multiple ionization of atomic argon by extreme-ultraviolet light pulses (62 nm, 100 fs in width, <2 x 10(14) W cm(-2)) at the free-electron laser facility in Japan, and observed highly charged ions with the charge state up to +6. The measured laser power dependence of the highly charged ions indicates that the multiple ionization proceeds via the sequential stripping of electrons.

• 出版日期2009-11-28
• 单位RIKEN