摘要

This letter introduces a localized microwave technique for direct excitation of solid materials for the sake of their identification by atomic emission spectroscopy. The microwave energy is concentrated on the material surface by a microwave-drill type applicator. The evolved similar to 1-mm(3) hotspot is slightly evaporated and excited as plasma. An optical spectrometer measures the atomic emission spectrum, hence enabling the material identification as in the known laser-induced breakdown spectroscopy (LIBS) technique. The experimental results demonstrate the conceptual feasibility of the localized microwave-induced breakdown spectroscopy as a low-cost substitute for the laser-based LIBS for material identification in scenarios in which a direct contact with the material to be identified and its slight destruction are permitted.

  • 出版日期2011-10