Nondestructive surface profiling of hidden MEMS using an infrared low-coherence interferometric microscope

作者：Krauter Johann^*; Osten Wolfgang

来源：Surface Topography: Metrology and Properties , 2018, 6(1): 015005.

DOI：10.1088/2051-672X/aaa0a8

• MEMS
• microscopy
• topography
• infrared
• lock-in signal evaluation
• infrared low-coherence interferometry

There are a wide range of applications for micro-electro-mechanical systems (MEMS). The automotive and consumer market is the strongest driver for the growing MEMS industry. A 100 % test of MEMS is particularly necessary since these are often used for safety-related purposes such as the ESP (Electronic Stability Program) system. The production of MEMS is a fully automated process that generates 90 % of the costs during the packaging and dicing steps. Nowadays, an electrical test is carried out on each individual MEMS component before these steps. However, after encapsulation, MEMS are opaque to visible light and other defects cannot be detected. Therefore, we apply an infrared low-coherence interferometer for the topography measurement of those hidden structures. A lock-in algorithm-based method is shown to calculate the object height and to reduce ghost steps due to the 2 pi-unambiguity. Finally, measurements of different MEMS-based sensors are presented.

• 出版日期2018-3