科研之友
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摘要
Thin titanium oxide nanotube arrays (TNAs) films were synthesized by supersonic anodization of titanium foil in an aqueous dimethyl sulfoxide solution containing HF. After anodization, TNAs up to 680 nm in length, 25 nm inner pore diameter, and 3 similar to 5 nm wall thickness were obtained. Their microstructure and surface morphologies were characterized by NRD and TEM. The optical absorption performances, cyclic voltammograms characteristics and light chemical conversion efficiencies of these films were tested. The results implied that the TNAs films have an outstanding accelerated electronic transportation and compressed recombination rate. Electrodes applying such kind of titania nanotubes will have a potential to further enhance the TNAs-based dye-sensitized solar cells efficiencies. The sonoelectrochemical mechanism of TNAs films formation was discussed along with the characterization and analysis of their films morphologies. TNAs were grown from a starting titanium sheet (20 similar to 50 mm wide, 99.9% purity) degreased by super-sonicating in 1 : 1 acetone and ethanol, followed by rinsing with deionized water and drying in air. Electrochemical anodization of titanium was carried out using a DC power supply (Chenghua, Shanghai, 0 similar to 60 V, 0 similar to 5 A), interfaced to a computer and equipped with a programmable function to control the current and voltage during an electrochemical process. Anodic films were grown from titanium by 40 V potentio-static anodization in dimethyl sulfoxide containing 0.5 mol.L-1 HF (standard 48% aqueous HF) for 24 h using a platinum foil counter electrode. The as-anodized nanotubes were amorphous, with crystallinity induced by a subsequent 300 similar to 600 degrees C anneal for 6 h in an ambient air with heating and cooling rates of 1 degrees C/min. Surface morphologies of the TNAs and titania nanoparticles electrodes were studied using a JEM-2010 transmission electron microscopy (Tokyo, Japan). The crystalline phases were detected and identified by X-ray diffractometer (XRD) on a D8 ADVANCE powder X-ray diffractometer (Bruker, Germany). The ultraviolet-visible (UV-Vis) absorbance spectra of the samples were measured using a HP-8453 UV-Visible spectrophotometer (Hewlett-Packard, US, 1 nm resolution) in combination with a Labsphere RSA-HP-53 diffuse reflectance and transmittance integrator (North Sutton, NH).
