科研之友
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摘要
A simple and unified model has been established for size-and composition-dependent dielectric constant epsilon(x, D) based on a size-dependent melting-temperature model, where x is the fraction of composition, D denotes the diameter of nanoparticles and nanowires, and the thickness of thin films. It demonstrates that depending on the dimension of nanocrystals, epsilon(x, D) decreases with different trend as D drops, while epsilon(x, D) is a nonlinear function of x. The theoretical prediction agrees approximately with experimental and computer simulation results of semiconductor nanocrystals in single phase or multiphases.
