摘要
A metal/oxide/molecule/oxide/Si capacitor structure containing redox-active ferrocene molecules has been fabricated for non-volatile memory application. Cyclic voltammetry and X-ray photoelectron spectroscopy were used to measure the molecules in the structure, showing that the molecules attach on SiO2/Si and the molecules are functional after device fabrication. These solid-state molecular memory devices have fast charge-storage speed and can endure more than 10(9) program/erase cycles. This excellent performance is derived from the intrinsic properties of the redox-active molecules and the hybrid Si-molecular device structure. These molecular devices are very attractive for future high-level non-volatile memory applications.
- 出版日期2013-7-29