Novel Dielectric Behaviors in PVDF-Based Semiconductor Composites

作者：Xu, Hai-Ping^*; Xie, Hua-Qing; Yang, Dan-Dan; Wu, Yi-Hua; Wang, Jing-Rong

来源：Journal of Applied Polymer Science, 2011, 122(5): 3466-3473.

DOI：10.1002/app.34362

• polymer-matrix composites
• dielectric property
• thermal properties

Composites of polyvinylidene fluoride (PVDF) filled with different conductive fillers as carbon black (CB), nickel (Ni), zinc (Zn), and tungsten (W), respectively, were prepared at same processing condition. The temperature dependence of dielectric behaviors of composites was studied at wide filler concentration and wide frequency ranges. Results show that there are giant dielectric constants as the concentration of filler is near the percolation threshold. The dielectric constants of all studied composites decrease slowly with increasing of frequency and rise gradually with increasing filler contents in the composites. Two relaxation peak regions of dielectric constant are observed from -30 to 40 degrees C and from 100 to 150 degrees C, which can be attributed to the contribution of polar effect of PVDF. The CB filled PVDF (CB/PVDF) composites present a lower percolation threshold than other metallic-filler filled PVDF composites. The maximal dielectric constant was found in the Ni filled PVDF (Ni/PVDF) composite. VC 2011 Wiley Periodicals, Inc. J Appl Polym Sci 122: 3466-3473, 2011

• 出版日期2011-12-5
• 单位上海第二工业大学