摘要

A sensitive, accurate, and real-time measurement of the photon beam profile is a crucial issue in synchrotron radiation experiments. Most common solutions include the use of insulated wires and phosphorescent materials with remote (in atmosphere) TV cameras. To face this request we designed and realized a micro-fabricated wire scanner fully UHV compatible, based on electrons photoemission under UV-X irradiation, suitable for in situ/on line beam characterization. The device provides micrometer accuracy, is compatible with most end-station sample holders, is easy to operate providing the requested information in a matter of minutes.

  • 出版日期2018-3