Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy

作者：Yoon Duhee; Son Young Woo; Cheong Hyeonsik^*

来源：Nano Letters, 2011, 11(8): 3227-3231.

DOI：10.1021/nl201488g

• Graphene
• Raman spectroscopy
• thermal expansion coefficient
• strain

The thermal expansion coefficient (TEC) of single-layer graphene is estimated with temperature-dependent Raman spectroscopy in the temperature range between 200 and 400 K. It is found to be strongly dependent on temperature but remains negative in the whole temperature range with a room temperature value of (-8.0 +/- 0.7) x 10(-6) K-1. The strain caused by the TEC mismatch between graphene and the substrate plays a crucial role in determining the physical properties of graphene, and hence its effect must be accounted for in the interpretation of experimental data taken at cryogenic or elevated temperatures.

• 出版日期2011-8