Atomic-Scale Tomography: A 2020 Vision

作者：Kelly Thomas F^*; Miller Michael K; Rajan Krishna; Ringer Simon P

来源：Microscopy and Microanalysis, 2013, 19(3): 652-664.

DOI：10.1017/S1431927613000494

• atomic-scale tomography
• atom probe microscopy
• atom probe tomography
• integrated computational materials engineering
• 2020 Vision

Atomic-scale tomography (AST) is defined and its place in microscopy is considered. Arguments are made that AST, as defined, would be the ultimate microscopy. The available pathways for achieving AST are examined and we conclude that atom probe tomography (APT) may be a viable basis for AST on its own and that APT in conjunction with transmission electron microscopy is a likely path as well. Some possible configurations of instrumentation for achieving AST are described. The concept of metaimages is introduced where data from multiple techniques are melded to create synergies in a multidimensional data structure. When coupled with integrated computational materials engineering, structure-properties microscopy is envisioned. The implications of AST for science and technology are explored.