A transimpedance amplifier for excess noise measurements of high junction capacitance avalanche photodiodes

作者：Green James E^*; David John P R; Tozer Richard C

来源：Measurement Science and Technology, 2012, 23(12): 125901.

DOI：10.1088/0957-0233/23/12/125901

• avalanche photodiode
• excess noise
• noise measurement
• high capacitance

This paper reports a novel and versatile system for measuring excess noise and multiplication in avalanche photodiodes (APDs), using a bipolar junction transistor based transimpedance amplifier front-end and based on phase-sensitive detection, which permits accurate measurement in the presence of a high dark current. The system can reliably measure the excess noise factor of devices with capacitance up to 5 nF. This system has been used to measure thin, large area Si pin APDs and the resulting data are in good agreement with measurements of the same devices obtained from a different noise measurement system which will be reported separately.

• 出版日期2012-12