摘要
In this study, a novel direction selection method using the two-dimensional complex discrete wavelet transform (2D-CDWT) is proposed. In order to achieve arbitrary direction selection, the directional filters are first designed. Calculation procedure of directional selection can be shown as follows: (1) The 16 sub-images are generally generated from the original image by the 2D-CDWT without a down-sampling process and the 12 sub-images that correspond to the high-frequency components are selected. (2) The 12 sub-images are filtered by using the designed directional filter. (3) The down-sampling process is carried out and the resulting images are obtained. Furthermore, this method is applied to the surface analysis of a wafer, and it is confirmed that our method is effective in detecting irregular direction components.
- 出版日期2010-7