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摘要
Ba0.75Sr0.25TiO3 film was epitaxially grown on a (001) LaAlO3 substrate using single-target pulsed laser deposition. The microstructure of the epitaxial film was investigated by conventional and high-resolution transmission electron microscopy. Apart from dislocations and stacking faults, two different kinds of antiphase boundaries, one being straight, and the other being zig-zagged, have been observed. The formation mechanism of these antiphase boundaries is discussed.
- 出版日期2011-2-28
- 单位青岛大学
