Highly Efficient Charge Separation and Collection across in Situ Doped Axial VLS-Grown Si Nanowire p-n Junctions

作者：Mohite A D^*; Perea D E; Singh S; Dayeh S A; Campbell I H; Picraux S T; Htoon H

来源：Nano Letters, 2012, 12(4): 1965-1971.

DOI：10.1021/nl204505p

• Minority carrier diffusion length
• photocurrent
• p-n junction
• nanowire
• scanning photocurrent microscopy

VLS-grown semiconductor nanowires have emerged as a viable prospect for future solar-based energy applications. In this paper, we report highly efficient charge separation and collection across in situ doped Si p-n junction nanowires with a diameter <100 nm grown in a cold wall CVD reactor. Our photoexcitation measurements indicate an internal quantum efficiency of similar to 50%, whereas scanning photocurrent microscopy measurements reveal effective minority carrier diffusion lengths of similar to 1.0 mu m for electrons and 0.66 mu m for holes for as-grown Si nanowires (d(NW) approximate to 65-80 nm), which are an order of magnitude larger than those previously reported for nanowires of similar diameter. Further analysis reveals that the strong suppression of surface recombination is mainly responsible for these relatively long diffusion lengths, with surface recombination velocities (S) calculated to be 2 orders of magnitude lower than found previously for as-grown nanowires, all of which used hot wall reactors. The degree of surface passivation achieved in our as-grown nanowires is comparable to or better than that achieved for nanowires in prior studies at significantly larger diameters. We suggest that the dramatically improved surface recombination velocities may result from the reduced sidewall reactions and deposition in our cold wall CVD reactor.

• 出版日期2012-4