A low-cost, high-magnification imaging system for particle sizing applications

作者：Tipnis Tanmay J^*; Lawson Nicholas J; Tatam Ralph P

来源：Measurement Science and Technology, 2014, 25(2): 027002.

DOI：10.1088/0957-0233/25/2/027002

• particle sizing
• long-working-distance microscope
• shadow-based imaging techniques
• high magnification
• high resolution

A low-cost imaging system for high magnification and high resolution was developed as an alternative to long-working-distance microscope-based systems, primarily for particle sizing applications. The imaging optics, comprising an inverted fixed focus lens coupled to a microscope objective, were able to provide a working distance of approximately 50 mm. The system magnification could be changed by using an appropriate microscope objective. Particle sizing was achieved using shadow-based techniques with the backlight illumination provided by a pulsed light-emitting diode light source. The images were analysed using commercial sizing software which gave the particle sizes and their distribution. A range of particles, from 6 to 8 mu m to over 100 mu m, was successfully measured with a minimum spatial resolution of approximately 2.5 mu m. This system allowed measurement of a wide range of particles at a lower cost and improved operator safety without disturbing the flow.

• 出版日期2014-2