A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

作者：Zhang, J. Y.; Liu, G.^*; Zhang, X.; Zhang, G. J.; Sun, J.; Ma, E.

来源：Scripta Materialia, 2010, 62(6): 333-336.

DOI：10.1016/j.scriptamat.2009.10.030

• Nanostructured multilayers
• Ductility
• Toughness
• Size effect

In Cu/Cr multilayers with modulation period (gamma) ranging from 10 to 250 nm, maxima are observed for both tensile ductility and fracture at a critical lambda similar to 50 nm, different from the monotonic lambda dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments, based on micromechanical model, by considering the competing thickness effects on t

• 出版日期2010-3
• 单位西安交通大学