A study of residual characteristics in floating gate transistors

作者:Wang, Jia; Zhao, Yiqiang; Xin, Ruishan; Ye, Mao*
来源:Science China Information Sciences, 2018, 61(6): 069402.
DOI:10.1007/s11432-017-9145-2

摘要

<正>Dear editor,The floating gate transistor is a device that has been extensively applied to non-volatile memories,such as EEPROM and Flash memories.The residual characteristics of floating gate transistors after program and erase(P/E)cycles are closely related