The effect of post deposition anneal temperature on the structure of BiFeO3-PbTiO3 thin films

作者：Bygrave Faye^*; Comyn Tim P; Bell Andrew J

来源：Thin Solid Films, 2012, 524: 26-29.

DOI：10.1016/j.tsf.2012.09.066

• Post anneal
• Pulsed laser deposition
• Bismuth ferrite
• Thin film
• X-ray diffraction
• Structural properties

Pulsed laser deposition was used to produce 0.7BiFeO(3)-0.3PbTiO(3) bismuth ferrite-lead titanate thin films on polycrystalline platinised silicon substrates. The films were post deposition annealed at different temperatures ranging from 500 to 700 degrees C in an oxygen atmosphere for 30 min. The films annealed at 500-550 degrees C possess a single perovskite phase tetragonal structure, with (001) preferred orientation appearing in films annealed at 550 degrees C. Films annealed at 600 degrees C possess a mixed tetragonal-rhombohedral perovskite phase structure with {100} preferential orientation. At anneal temperatures between 650 and 700 degrees C, non-perovskite secondary phases are present with the film structure. The ability to tailor film crystallographic structure and texture using varying anneal temperatures is discussed.

• 出版日期2012-12-1