科研之友
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摘要
When the excitation energy, is in the vicinity of the absorption-edge of an element, X-ray emission, following the absorption, is called resonant inelastic X-ray scattering (RIXS). RIXS is much more highly, sensitive to chemical-states of the element than conventional fluorescent X-ray's. Thus, RIXS can be a useful "fingerprint" in material characterization. In this article, the basic aspects of RIXS spectroscopy, are surveyed while emphasizing the relationship to X-ray, absorption fine structures and fluorescent X-ray spectra. Also, its applications to analytical chemistry, are discussed along with several recent examples.
- 出版日期2010-6
