A Noninvasive Method for Nanoscale Electrostatic Gating of Pristine Materials

作者：Beukman Arjan J A; Qu Fanming; West Ken W; Pfeiffer Loren N; Kouwenhoven Leo P^*

来源：Nano Letters, 2015, 15(10): 6883-6888.

DOI：10.1021/acs.nanolett.5b02800

• Nanoscale gating
• Fabry-Perot interferometer
• flip-chip
• noninvasive
• Quantum Hall effect

Electrostatic gating is essential for defining and control of semiconducting devices. However, nanofabrication processes required for depositing gates inevitably degrade the pristine quality of the material of interest. Examples of materials that suffer from such degradation include ultrahigh mobility GaAs/AlGaAs two-dimensional electron gases (2DEGs), graphene, topological insulators, and nanowires. To preserve the pristine material properties, we have developed a flip-chip setup where gates are separated from the material by a vacuum, which allows nanoscale electrostatic gating of the material without exposing it to invasive nanoprocessing. An additional benefit is the vacuum between gates and material, which, unlike gate dielectrics, is free from charge traps. We demonstrate the operation and feasibility of the flip-chip setup by achieving quantum interference at integer quantum Hall states in a Fabry-Perot interferometer based on a GaAs/AlGaAs 2DEG. Our results pave the way for the study of exotic phenomena including fragile fractional quantum Hall states by preserving the high quality of the material.

• 出版日期2015-10