A Note on %26quot;Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk%26quot;

作者：Pearn W L; Wu C H^*; Tsai M C

来源：Quality and Reliability Engineering International, 2013, 29(2): 159-163.

DOI：10.1002/qre.1295

• critical values
• lower confidence bounds
• multiple characteristics
• one-sided specification
• process capability index

The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example.

• 出版日期2013-3