科研之友
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摘要
We measured the X-ray photoelectron spectroscopy spectra of the La-incorporated Hf oxide and observed the apparent Hf 4f peak shift toward a lower energy as La concentration increased. To investigate the origin of these peak shifts, we performed first-principles calculations, in which the degree and direction of the obtained peak shifts agreed well with the above-mentioned experimentally observed spectra. Also, we found that the main reason for these peak shifts was the charge-transfer effect. Estimation of the degree of the interface dipole was made possible by a comparison between the experimental values and the theoretical values of the peak shifts.
- 出版日期2012-4
