作者：Moraes Lucas; Carmo Luiz C Jr; Campos Rafael F; Juca Marco A; Moreira Lucas S; Carvalho Joao Pedro; Texeira Alexandre M; Silveira Daniel D; Coelho Thiago V N*; Luis Andre; Marcato M; dos Santos Alexandre B
来源：IEEE Aerospace and Electronic Systems Magazine, 2017, 32(3): 58-62.
DOI：10.1109/MAES.2017.160038
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