Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices

作者：Johnston Allan H^*

来源：IEEE Transactions on Device and Materials Reliability, 2010, 10(4): 449-459.

DOI：10.1109/TDMR.2010.2048111

• Microelectronics
• optoelectronics
• radiation damage
• reliability
• space radiation

The interplay between radiation effects and reliability is discussed for micro- and optoelectronic devices. Topics discussed include basic approaches such as burn-in and electrical screening that are used to improve component reliability, synergistic effects between reliability and radiation effects, the impact of microdose damage from heavy ions on reliability of high-density digital circuits, and assessing the overall risk to components in space that are subjected to overstress conditions.

• 出版日期2010-12