Scanning Noise Microscopy on Graphene Devices

作者：Sung Moon Gyu; Lee Hyungwoo; Heo Kwang; Byun Kyung Eun; Kim Taekyeong; Seo David H; Seo Sunae; Hong Seunghun^*

来源：ACS Nano, 2011, 5(11): 8620-8628.

DOI：10.1021/nn202135g

• atomic force microscopy
• scanning noise microscopy
• low-frequency noise
• graphene strip
• nanodevice

We developed a scanning noise microscopy (SNM) method and demonstrated the nanoscale noise analysis of a graphene strip-based device. Here, a Pt tip made a direct contact on the surface of a nanodevice to measure the current noise spectrum through it. Then, the measured noise spectrum was analyzed by an empirical model to extract the noise characteristics only from the device channel. As a proof of concept, we demonstrated the scaling behavior analysis of the noise in graphene strips. Furthermore, we performed the nanoscale noise mapping on a graphene channel, allowing us to study the effect of structural defects on the noise of the graphene channel. The SNM method is a powerful tool for nanoscale noise analysis and should play a significant role in basic research on nanoscale devices.

• 出版日期2011-11