科研之友
微信
新浪微博
Facebook
分享链接
摘要
We report a high resolution scanning near-field circular polarization optical microscope (SNCPOM) for detecting magnetic nanodot arrays' magnetization. It employs an atomic force cantilever with a hollow appeared on its top as an apertureless optical probe. The hollow is coated using Au. Illumination near field light (NFL) will emit from the apex of probe when far field light (FFL) is focused on the hollow by using an objective lens. Both reflection NFL and are gathered by the lens. There is a phase difference between reflection NFL and FFL relate to cantilever's geometry and the distance between cantilever and sample. And the reflection FFL is eliminated using a Glan-Taylor analyzer according to the phase difference. Non-magnetic and magnetic nanodot arrays are tested using this system. The spatial resolution of SNCPOM is less than 12 nm. Inverse near-field light intensity images of magnetic nanodot with applied extra-magnetic field (0 T and 0.6 T) are obtained. It indicates that the polarization direction of near-field light is changed by the vertical magnetic field of isolated magnetic nanodot.
- 出版日期2017-1
- 单位上海理工大学
