A RELIABILITY STUDY OF SQUARE WAVE BURSTING beta-CELLS WITH NOISE

作者：Wang Jiaoyan^*; Su Jianzhong; Gonzalez Humberto Perez; Rubin Jonathan

来源：Discrete and Continuous Dynamical Systems-Series B, 2011, 16(2): 569-588.

DOI：10.3934/dcdsb.2011.16.569

• Square wave bursting
• reliability
• gap junction coupling
• synaptic coupling

Reliability of spike timing has been a hot topic recently. However reliability has not been considered for bursting behavior, as commonly observed in a variety of nerve and endocrine cells, including beta-cells in intact pancreatic islets. In this paper, reliability of beta-cells with noise is considered. A method to numerically study reliability of bursting cells is presented. Reliability of a single cell will decrease as noise level becomes larger. The reliability of networks of beta-cells coupled by gap junctions or synaptic excitation is investigated. Simulations of the network of beta-cells reveal that increasing noise level decreases the reliability. But the reliability of the network is higher than that of single cell. The effect of coupling strength on reliability is also investigated. Reliability will decrease when coupling strength is small and increase when coupling strength is large.

• 出版日期2011-9
• 单位北京航空航天大学