Measuring a narrow Bessel beam spot by scanning a charge-coupled device (CCD) pixel

作者：Tiwari S K^*; Ram S P; Jayabalan J; Mishra S R

来源：Measurement Science and Technology, 2010, 21(2): 025308.

DOI：10.1088/0957-0233/21/2/025308

• spot size
• scanning CCD-pixel
• nondiffracting Bessel beam

By scanning a charge-coupled device (CCD) camera transverse to the beam axis and observing the variation in counts on a marked pixel, we demonstrate that we can measure a laser beam spot size smaller than the size of the CCD-pixel. We find this method particularly attractive for measuring the size of central spot of a Bessel beam, for which the established scanning knife-edge method does not work appropriately because of the large contribution of the rings surrounding the central spot to the signal.

• 出版日期2010-2