A compact microstructure mechanical property measuring system

作者:Chen Tao*; Zhang Lin; Wu Jian; Liu Shibing; Zuo Tiechuan
来源:3rd IEEE International Conference of Nano/Micro Engineered and Molecular Systems, 2008-01-06 to 2008-01-09.

摘要

In this paper, we introduce a compact measuring system, to analyze microstructure force property. The system is specially designed in which a mechanical test machine, a PCB board based on an USB connection for device driving and data collection, and processing software were contained. This system can be used for measuring deformation characteristics of MEMS structures by bending method. To confirm the feasibility of the system, an experiment was performed on a micro pillar.