摘要
We present a new nonlinear optical technique to probe chirality, i.e., lack of reflection symmetry of surfaces and thin molecular films. The technique is based on second-harmonic generation and focusing of circularly polarized light at normal incidence on the sample. Because of the high symmetry of the experimental mental arrangement; the technique provides an unambiguous probe of chirality in. the sense that it avoids false chiral signatures,arising from possible in-plane anisotropy of the sample. The technique is verified by using two Langmuir-Blodgett thin films, one chiral and anisotropic, the other achiral and anisotropic, where the latter acted as a reference. Due to the focusing condition, the technique is also naturally applicable to nonlinear chiral microscopy of surfaces and interfaces.
- 出版日期2010-6-17