科研之友
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摘要
We describe the displacement detection of freestanding silicon [111] nanowires by fiber-optic interferometry. We observe approximately a 50-fold enhancement in the scattered intensity for nanowires 40-60 nm in diameter for incident light polarized parallel to the nanowire axis, as compared to perpendicular polarization. This enhancement enables us to achieve a displacement sensitivity of 0.5 pm/Hz for 15 mu W of light incident on the nanowire. The nanowires exhibit ultralow mechanical dissipation in the range of (2x10(-15))-(2x10(-14)) kg/s and could be used as mechanical sensors for ultrasensitive scanning probe force measurements.
- 出版日期2008-11-10
- 单位西北大学
