A Multiobjective Heuristic for ICs Test Suite Reduction

作者：Huang Yue^*; Xu Wenbo

来源：International Symposium on Distributed Computing and Applications to Business, Engineering and Science, 2008-07-27 to 2008-07-31.

• heuristic
• ICs test
• test suite reduction

It spends more and more time for testing in the process of designing ICs with the increasing complexity of ICs. Test efficiency is becoming increasingly important. Large numbers of redundant test cases in ICs test suite result in reducing ICs test efficiency greatly. This paper has analyzed Greedy algorithm, GE and GRE proposed by Chen and a heuristic base on the importance of test cases proposed by Harrold which are used in test suite reduction. At the same time a new heuristic (PrioritySelected) for ICs test suite reduction base on the cases 'essentialness' and number of tested ICs faults is presented. An optimal representative suite of an example selected by the heuristic (PrioritySelected) is presented in this paper. It is proved that the heuristic (PrioritySelected) is effectual.

• 出版日期2008
• 单位江南大学