High-temperature Electrical Behavior of a 2D Multilayered MoS2 Transistor

作者:Lee Yeonsung*; Park Heekyeong; Kwon Junyeon; Inturu Omkaram; Kim Sunkook
来源:Journal of the Korean Physical Society, 2014, 64(7): L945-L948.
DOI:10.3938/jkps.64.945

摘要

This paper reports the high-temperature-dependent electrical behavior of a 2D multilayer MoS2 transistor. The existence of a big Schottky barrier at the MoS2-Ti junction can reduce carrier transport and lead to a lower transistor conductance. At a high temperature (380 K), the field-effect mobility of the multilayer MoS2 transistor increases to 16.9 cm(2) V-1 sec(-1), which is 2 times higher than the value at room temperature. These results demonstrate that at high temperature, carrier transport in a MoS2 with a high Schottky barrier is mainly affected by thermionic emission over the energy barrier.

  • 出版日期2014-4