摘要

Precession electron diffraction (PED) is used to acquire orientation information in Cu-Nb nanolamellar composites fabricated by accumulative roll bonding (ARB). The resulting maps quantify the grain size, shape, orientation distributions and interface planes in the vicinity of nanometer-thick deformation twins. The PED-based texture results compare favorably with bulk textures provided by neutron diffraction measurements, indicating uniformity in the ARB Cu-Nb texture. Additionally, {112}(Cu)parallel to{112}(Nb) interfaces are present, suggesting that ARB techniques can lead to stable interfaces with a special crystallography.

  • 出版日期2012-8
  • 单位Los Alamos