Application of nanosphere lithography to charge trap flash memories with patterned Si3N4 trap layers

作者：An Ho Myoung; Kim Hee Dong; You Hee Wook; Kim Kyeong Heon; Sung Yun Mo; Cho Won Ju; Kim Tae Geun^*

来源：Microelectronic Engineering, 2012, 98: 347-350.

DOI：10.1016/j.mee.2012.07.061

• Charge trap flash
• SONOS
• Nanosphere lithography
• Memory-trap density

In this paper, nanosphere lithography (NSL) is applied to the surface of the Si3N4 trap layer in the charge trap flash device to improve its memory characteristics. A 500-nm-diameter polystyrene bead array was used as a mask to make patterns on the surface of the Si3N4 trap layer during etching processes using CF4 gases. The pattern depth measured by atomic force microscope was about 4 nm. The metal-aluminum oxide-nitride-oxide-silicon capacitor that has a patterned surface shows a larger capacitance-voltage memory window of 5 V, higher tunneling current at bias voltages higher than 10 V. and faster program speeds of 50 ms, as compared to those measured from the capacitor with the flat surface. These results are thought to be due to abundant memory traps available at the interface between the nitride and top oxide formed by NSL.

• 出版日期2012-10