A compact 2D potential model for subthreshold characterization of nanoscale fully depleted short channel nanowire MOSFETs

作者:Xi Liu*; Xiao Shi Jin; Chuai Rongyan; Jong Ho Lee
来源:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields , 2015, 28(2): 222-230.
DOI:10.1002/jnm.2001

摘要

In this work, a compact subthreshold model for fully depleted nanoscale short channel nanowire MOSFETs is proposed. It is based on an approximated solution of two-dimensional Poisson's Equation in cylindrical coordinate system. It matches well with technology computer-aided design simulation results in a wide range variation of design parameters without introducing any empirical fitting parameters.