A note on order statistics-based parametric pattern classification

作者：Hu, Lixia^*

来源：Pattern Recognition, 2015, 48(1): 43-49.

DOI：10.1016/j.patcog.2014.07.021

• Pattern classification
• Order Statistics (OS)
• Classification by Moments of Order
• Statistics (CMOS)

Recently, a novel classification paradigm is proposed, named Classification by Moments of Order Statistics (CMOS), which is shown to attain the optimal Bayesian bound for symmetric distributions and a near-optimal accuracy for asymmetric distributions [13,9]. However, in the process of deriving the order statistics-based classification scheme, the authors use a plausible relation "E[Phi(x(k,n))] = k/(n+1)double right arrow E[x(k,n)] = Phi(-1)(k/(n+1))", where Phi is the cumulative distribution function of random variable X, and X-k,X-n is the k-th order statistics of a sample of size n from X. Therefore, the new approach actually should be viewed as the classification scheme based on the percentiles of distribution, instead of the so-called order statistics-based classification. In this paper, we will build the CMOS using 2-OS criteria in its true sense. Furthermore, we show that the order statistics-based classification reaches the optimal Bayesian bound for symmetric distributions, and compare the accuracy of CMOS, Bayesian classification, median-based classifier and percentiles-based classification for non-symmetric distributions. The theoretical results are verified by rigorous experiments as well.

• 出版日期2015-1
• 单位上海财经大学