Dot Sensitivity Analysis for Topology Optimization of Dielectric Material in Electrostatic System

作者：Lee Kang Hyouk; Hong Seung Geon; Park Il Han^*

来源：IEEE Transactions on Magnetics, 2017, 53(6): 9401404.

DOI：10.1109/TMAG.2017.2655265

• Dot sensitivity
• electrostatic system
• level set method
• topology optimization

In this paper, a dot sensitivity analysis is proposed for the topology optimization of dielectric materials in an electrostatic system. Dot sensitivity formula is analytically derived in closed form using the continuum shape sensitivity formula. The level set method is used for evolving the geometry in the topology optimization. As the dot sensitivity analysis can generate new material in a vacant region, it does not require an initial design for the dielectric material and widens the design space. Two numerical examples are tested to show the usefulness of dot sensitivity analysis.

• 出版日期2017-6