Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

作者：Gayer C W^*; Hemmers D; Stelzmann C; Pretzler G

来源：Optics Letters, 2013, 38(9): 1563-1565.

DOI：10.1364/OL.38.001563

We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers-Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum K-alpha radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al K-alpha radiation (0.834 nm, 1.49 keV).

• 出版日期2013-5-1